ANSHUL JOON. THE ABSENCE OF P-N TRANSITION IN BI-MODIFIED NON-CRYSTALLINE THIN FILMS OF GE20TE80-XBIX IS DEMONSTRATED BY THE ELECTRONIC CONDUCTIVITY. Journal of Validation Technology, ISSN: 1079-6630, E-I SSN: 2150-7090 UGC CARE II, [S. l.], v. 30, n. 4, p. 76–80, 2025. DOI: 10.1080/jvtnetwork.v30i4.138. Disponível em: https://jvtnetwork.com/index.php/journals/article/view/138. Acesso em: 13 sep. 2025.